Mutual interference in calibration line configurations
Schmuckle F.J., Probst T., Arz U., Phung G.N., Doerner R. , Heinrich W.Coupling, em simulation, measurements, parasitic modes, probes
Document type | Article |
Journal title / Source | 2017 89th ARFTG Microwave Measurement Conference (ARFTG) |
Publisher's name | IEEE |
Publication date | 2017-6 |
DOI | 10.1109/ARFTG.2017.8000823 |
Web URL | https://www.fbh-berlin.com/publications-patents/publications/title/mutual-interference-in-calibration-line-configurations |
Language | English |