Mutual interference in calibration line configurations

Schmuckle F.J., Probst T., Arz U., Phung G.N., Doerner R. , Heinrich W.
Keywords:

Coupling, em simulation, measurements, parasitic modes, probes

Document type Article
Journal title / Source 2017 89th ARFTG Microwave Measurement Conference (ARFTG)
Publisher's name IEEE
Publication date 2017-6
DOI 10.1109/ARFTG.2017.8000823
Web URL https://www.fbh-berlin.com/publications-patents/publications/title/mutual-interference-in-calibration-line-configurations
Language English

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