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The existence of a lateral size effect and the relationship between indentation and scratch hardness in copper

Kareer, A., Hou, X.D., Jennett, N.M. and Hainsworth, S.V.
Keywords:

Nano-scratch testing, nano-scratch hardness, lateral size effects

Document typeArticle
Journal title / SourcePhilosophical Magazine
Volume96
Issue32-34
Page numbers / Article number3396-3413
Publisher's nameInforma UK Limited
Publication date 2016-03-24
ISSN1478-6435, 1478-6443
DOI10.1080/14786435.2016.1146828
Web URLhttps://pure.coventry.ac.uk/ws/portalfiles/portal/10344470/Nigel_Jennett_Manuscript_revised.pdf
LanguageEnglish

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