On-Wafer Series-Through Broadband Measurement of Sub-fF55-nm MOS RF Voltage-Tunable Capacitors
Daffé K., Dambrine G., Durand C., Gaquiere C., Haddadi K.Microwave, on-wafer, S-parameters, capacitor, uncertainty
| Document type | Article |
| Journal title / Source | IEEE Microwave and Wireless Components Letters |
| Volume | 28 |
| Issue | 9 |
| Page numbers / Article number | 831-833 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | 445 Hoes Lane Piscataway NJ 08855-1331 United States |
| Publication date | 2018-9 |
| ISSN | 1531-1309, 1558-1764 |
| DOI | 10.1109/LMWC.2018.2851386 |
| Web URL | https://hal.archives-ouvertes.fr/hal-01873048 |
| Language | English |