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Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers

Haddadi, K. (IEMN-Univ-Lille1, France), Dambrine, G. (IEMN-Univ-Lille1, France), Lozar, R., Helmreich, K., Gold, G., Lomakin, K., Heinrich, W., Phung, G.N., Zeier, M., Wollensack, M., Hoffmann, J., Mubarak, F., Shang, X., Ridler, N. (National Physical Laboratory, Teddington, United Kingdom), Kuhlmann, K. (PTB, Braunschweig, Germany), Probst, T., Arz, U. (PTB, Braunschweig, Germany), Spirito, M. (TU Delft) and Clarke, R. (University of Leeds, Leeds, United Kingdom)

Calibration, on-wafer, S-parameters, traceability, uncertainty budget, coplanar waveguide (CPW), electromagnetic field simulation, parasitic modes, substrate modes, multiline-thru-reflect-line (mTRL), microwave probes, extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer (VNA)

Document typeGood Practice Guide
Publisher's namePhysikalisch-Technische Bundesanstalt (PTB)
Publication date 2019-04-24
Web URLhttps://oar.ptb.de/resources/show/10.7795/530.20190424B

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