Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers
Haddadi K., Dambrine G., Lozar R., Helmreich K., Gold G., Lomakin K., Heinrich W., Phung G.N., Zeier M., Wollensack M., Hoffmann J., Mubarak F., Shang X., Ridler N., Kuhlmann K., Probst T., Arz U., Spirito M., Clarke R.Calibration, on-wafer, S-parameters, traceability, uncertainty budget, coplanar waveguide (CPW), electromagnetic field simulation, parasitic modes, substrate modes, multiline-thru-reflect-line (mTRL), microwave probes, extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer (VNA)
Document type | Good Practice Guide |
Journal title / Source | |
Publisher's name | Physikalisch-Technische Bundesanstalt (PTB) |
Publication date | 2019-4-24 |
DOI | 10.7795/530.20190424B |
Web URL | https://oar.ptb.de/resources/show/10.7795/530.20190424B |
Language | English |