Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers

Haddadi K., Dambrine G., Lozar R., Helmreich K., Gold G., Lomakin K., Heinrich W., Phung G.N., Zeier M., Wollensack M., Hoffmann J., Mubarak F., Shang X., Ridler N., Kuhlmann K., Probst T., Arz U., Spirito M., Clarke R.
Keywords:

Calibration, on-wafer, S-parameters, traceability, uncertainty budget, coplanar waveguide (CPW), electromagnetic field simulation, parasitic modes, substrate modes, multiline-thru-reflect-line (mTRL), microwave probes, extreme impedance measurement, impedance mismatch, microwave interferometry, nanoelectronics, nanostructures, noise, vector network analyzer (VNA)

Document type Good Practice Guide
Journal title / Source
Publisher's name Physikalisch-Technische Bundesanstalt (PTB)
Publication date 2019-4-24
DOI 10.7795/530.20190424B
Web URL https://oar.ptb.de/resources/show/10.7795/530.20190424B
Language English

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