SIMS of Organic Materials—Interface Location in Argon Gas Cluster Depth Profiles Using Negative Secondary Ions
Havelund R., Seah M. P., Tiddia M., Gilmore I. S.SIMS
| Document type | Article |
| Journal title / Source | Journal of The American Society for Mass Spectrometry |
| Volume | 29 |
| Issue | 4 |
| Page numbers / Article number | 774-785 |
| Publisher's name | Springer US |
| Publication date | 2018-2-21 |
| ISSN | 1044-0305, 1879-1123 |
| DOI | 10.1007/s13361-018-1905-2 |
| Web URL | https://link.springer.com/article/10.1007%2Fs13361-018-1905-2 |
| Language | English |