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SIMS of organics - Advances in 2D and 3D imaging and future outlook

Gilmore, I.
Keywords:

Secondary ion mass spectroscopy; Sputtering; Ionization; Medical imaging; Mass spectrometry; Matrix assisted laser desorption ionization; Focused ion beam technology; Ion beams; Ion sources; Spatial resolution

Document typeArticle
Journal title / SourceJournal of Vacuum Science & Technology
Volume31
Issue5
Publication date 2013-08-27
ISSN0734-2101
DOI10.1116/1.4816935
Web URLhttp://link.aip.org/link/?JVA/31/050819
LanguageEnglish

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