Re-evaluation of uncertainty for calibration of 100 MΩ and 1 GΩ resistors at NPL

Giblin S.P.
Keywords:

Resistance traceability, resistance standards, small current measurements, Cryogenic Current Comparators

Document type Article
Journal title / Source Metrologia
Volume 56
Issue 1
Page numbers / Article number 015014
Publisher's name IOP Publishing
Publication date 2018-12-21
ISSN 0026-1394, 1681-7575
DOI 10.1088/1681-7575/aaf52d
Web URL https://arxiv.org/abs/1808.09214
Language English

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