Application of contact-resonance AFM methods to polymer samples
Friedrich S., Cappella B.atomic force microscopy, contact resonance, mechanical properties, polymers; wear
Document type | Article |
Journal title / Source | Beilstein Journal of Nanotechnology |
Volume | 11 |
Page numbers / Article number | 1714-1727 |
Publisher's name | Beilstein Institut |
Publication date | 2020-11-12 |
ISSN | 2190-4286 |
DOI | 10.3762/bjnano.11.154 |
Language | English |