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Application of contact-resonance AFM methods to polymer samples

Friedrich, S. and Cappella, B.
Keywords:

atomic force microscopy, contact resonance, mechanical properties, polymers; wear

Document typeArticle
Journal title / SourceBeilstein Journal of Nanotechnology
Volume11
Page numbers / Article number1714-1727
Publisher's nameBeilstein Institut
Publication date 2020-11-12
ISSN2190-4286
DOI10.3762/bjnano.11.154
LanguageEnglish

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