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Analytical Jacobian and its application to tilted-wave interferometry

Fortmeier, I., Stavridis, M., Wiegmann, A., Schulz, M., Osten, W. and Elster, C.
Keywords:

Geometric optics : Mathematical methods (general), Interferometry, Metrology, Aspherics

Document typeArticle
Journal title / SourceOptics Express
Volume22
Issue18
Page numbers / Article number21313-21325
Publication date 2014-08
Web URLhttp://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-22-18-21313
LanguageEnglish

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