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Photometric Characterization Of Extended Sources By Subsource Goniospectroradiometry

Ferrero, A., Velázquez, J.L., Hernanz, M.L. (Spanish National Research Council (CSIC)), Campos, J. and Pons, A.
Keywords:

GONIOSPECTRORADIOMETRY, OLED, photometry, near-field, sub-source

Document typeProceeding
Journal title / SourceProceedings of the CIE Tutorial and Expert Symposium on the CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard
Volume1
Page numbers / Article number24-33
Publisher's nameCommission Internationale de L'Eclairage
Publisher's address (city only)CIE Central Bureau, Babenbergerstraße 9/9A, 1010 Vienna, Austria
Publication date 2015-11-26
Conference nameCIE Tutorial and Expert Symposium on the CIE S 025 LED Lamps, LED Luminaires and LED Modules Test Standard
Conference date26-11-2015 to 26-11-2015
Conference placeBraunschweig, Germany
ISBN978-3-902842-28-2
LanguageEnglish

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