An insight into the present capabilities of national metrology institutes for measuring sparkle
Ferrero A., Basic N., Campos J., Pastuschek M., Perales E., Porrovecchio G., Smid M., Schirmacher A., Velázquez J.L. , Martínez-Verdú F.sparkle, texture, reflectance, contrast threshold, gonio-spectrophotometry
Document type | Article |
Journal title / Source | Metrologia |
Volume | 57 |
Issue | 6 |
Page numbers / Article number | 065029 |
Publisher's name | IOP Publishing |
Publication date | 2020-11-11 |
ISSN | 0026-1394, 1681-7575 |
DOI | 10.1088/1681-7575/abb0a3 |
Language | English |