An insight into the present capabilities of national metrology institutes for measuring sparkle

Ferrero A., Basic N., Campos J., Pastuschek M., Perales E., Porrovecchio G., Smid M., Schirmacher A., Velázquez J.L. , Martínez-Verdú F.
Keywords:

sparkle, texture, reflectance, contrast threshold, gonio-spectrophotometry

Document type Article
Journal title / Source Metrologia
Volume 57
Issue 6
Page numbers / Article number 065029
Publisher's name IOP Publishing
Publication date 2020-11-11
ISSN 0026-1394, 1681-7575
DOI 10.1088/1681-7575/abb0a3
Language English

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