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Thermal/luminescence characterization and degradation mechanism analysis on phosphor-converted white LED chip scale packages

Fan, X., Qian, C., Yu, C., Fan, J. and ZHAO, G.
Keywords:

Phosphor-converted white LED, Chip scale packages, Multicolor phosphors, Thermal/luminescence characterization, Degradation mechanisms

Document typeArticle
Journal title / SourceMicroelectronics Reliability
Volume74
IssueJuly 2017
Page numbers / Article number179–185
Publisher's namedongsheng ZHAO
Publisher's address (city only)New York
Publication date 2017-04
ISSN0026-2714
DOI10.1016/j.microrel.2017.04.012
Web URLhttp://www.sciencedirect.com/science/article/pii/S0026271417301026
LanguageEnglish

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