Evaluation of EMI Effects on Static Electricity Meters
Wright, P.S., Rietveld, G., Leferink, F. (University Twente, Enschede, the Netherlands), van den Brom, H.E., Alonso, F.R.I, Braun, J.P., Ellingsberg, K., Pous, M. and Svoboda, M. (CMI)Electromagnetic Compatibility, EMC immunity testing, energy measurement, static meters, standards, watthour meters.
| Document type | Article |
| Journal title / Source | 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) |
| Publisher's name | IEEE |
| Publication date | 2018-07 |
| DOI | 10.1109/CPEM.2018.8500945 |
| Web URL | https://zenodo.org/record/3587786#.XiGxp3u7KUn |
| Language | English |