Optical measurement of absolute flatness with the deflectometric measurement systems at PTB
Ehret G., Schulz M., Baier M., Fitzenreiter A.| Document type | Proceedings |
| Journal title / Source | Journal of Physics: Conference Series: (2013) |
| Publisher's name | IOP |
| Publication date | 2013 |
| Conference name | 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012) |
| Conference date | 09 - 13 July 2012 |
| Conference place | Lyon, France |
| ISSN | ISSN 1742-6596 |
| Web URL | http://iopscience.iop.org/1742-6596/425/15/152016/pdf/1742-6596_425_15_152016.pdf |