Ultrastable Low-Noise Current Amplifiers With Extended Range and Improved Accuracy
Drung Dietmar, Krause ChristianResistors, Current measurement, Uncertainty, Standards, Temperature measurement, Measurement uncertainty, Resistance
| Document type | Article |
| Journal title / Source | IEEE Transactions on Instrumentation and Measurement |
| Volume | PP |
| Issue | 99 |
| Page numbers / Article number | 1-8 |
| Publisher's name | Institute of Electrical and Electronics Engineers (IEEE) |
| Publisher's address (city only) | 445 Hoes Lane, Piscataway, NJ 08855-1331, United States |
| Publication date | 2016-9-30 |
| ISSN | 0018-9456, 1557-9662 |
| DOI | 10.1109/TIM.2016.2611298 |
| Language | English |