Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy

Haddadi K., Polovodov P., Theron D., Dambrine G.
Keywords:

Near-field , microwave, microscopy

Document type Proceedings
Journal title / Source 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
Publisher's name IEEE
Publication date 2018-7
Conference name 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
Conference date 04-07-2018 to 08-07-2018
Conference place Nagoya - Japan
DOI 10.1109/MARSS.2018.8481160
Web URL https://hal.archives-ouvertes.fr/hal-01913677
Language English

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