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Lens aberration compensation in interference microscopy

Su, R., Thomas, M., Liu, M., Drs, J., Bellouard, Y., Pruss, C., Coupland, J. and Leach, R.

Lens aberration interference microscopy

Document typeArticle
Journal title / SourceOptics and Lasers in Engineering
Page numbers / Article number106015
Publisher's nameElsevier BV
Publisher's address (city only)Elsevier BV Radarweg 29 Amsterdam NX 1043 Netherlands
Publication date 2020-05

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