Traceable metrology for characterizing quantum optical communication devices

Chunnilall C J, Lepert G, Allerton J J, Hart C J, Sinclair A G
Keywords:

Metrology, quantum key distribution, single-photon

Document type Article
Journal title / Source Metrologia
Volume 51
Issue 6
Page numbers / Article number 10
Publication date 2014-11-20
ISSN 0026-1394
DOI 10.1088/0026-1394/51/6/S258
Web URL http://iopscience.iop.org/0026-1394/

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