Mid-Infrared Silicon-on-Insulator Fourier-Transform Spectrometer Chip

Nedeljkovic Milos, Velasco Aitor V., Khokhar Ali Z., Delage Andre, Cheben Pavel
Keywords:

mid-IR, spectrometry, silicon photonics

Document type Article
Journal title / Source IEEE Photonics Technology Letters
Volume 28
Issue 4
Page numbers / Article number 528-531
Publisher's name Institute of Electrical and Electronics Engineers (IEEE)
Publisher's address (city only) 445 Hoes Lane Piscataway NJ 08855-1331 United States
Publication date 2016-2-15
ISSN 1041-1135, 1941-0174
DOI 10.1109/LPT.2015.2496729
Web URL http://hdl.handle.net/10261/167745
Language English

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