Alternative conducted emission measurements with LISN simulation & CISPR 16 Voltage Probe
Çetintaş M., Acak S., Çakır S., Şen O.Alternative; Voltage; Probe; Conducted Emission; EMC; Industry; In-Situ; LISN; Mains Impedance; On-Site
| Document type | Proceedings |
| Journal title / Source | 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC Europe 2015) |
| Volume | 2015 |
| Issue | 2015 |
| Page numbers / Article number | 1243-1247 |
| Publisher's name | IEEE |
| Publication date | 2015-8-22 |
| Conference name | 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC Europe 2015) |
| Conference date | 16-08-2015 to 22-08-2015 |
| Conference place | Dresden |
| DOI | 10.1109/ISEMC.2015.7256348 |
| Language | English |