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Surface layer determination for the Si spheres of the Avogadro project

Busch, I., Azuma, Y., Bettin, H., Cibik, L., Fuchs, P., Fujii, K., Krumrey, M., Kutegens, U., Kuramoto, N. and Mizushima, S.
Keywords:

surface layer, XPS measurements, XRF measurements.

Document typeArticle
Journal title / SourceMetrologia
Volume48
Issue2
Publication date 2011-03-22
DOI10.1088/0026-1394/48/2/S10
LanguageEnglish

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