Advanced fault location in MTDC networks utilising optically-multiplexed current measurements and machine learning approach

Booth C., Tzelepis D., Dysko A., Fusiek G., Niewczas P., Mirsaeidi S., Dong X.
Keywords:

Fault location, Multi-terminal direct current, Travelling waves, Optical sensors, Machine learning, Pattern recognition

Document type Article
Journal title / Source International Journal of Electrical Power & Energy Systems
Volume 97
Page numbers / Article number 319-333
Publisher's name Elsevier BV
Publication date 2018-4
ISSN 0142-0615
DOI 10.1016/j.ijepes.2017.10.040
Language English

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