METAS-CT: Metrological X-ray computed tomography at sub-micrometre precision
Bircher B., Meli F., Küng A., Thalmann R.Industrial X-ray computed tomography, dimensional metrology, high-resolution, microtechnology, micro-parts, additive manufacturing
| Document type | Proceedings |
| Journal title / Source | Proceedings 20th euspen International Conference and Exhibition |
| Publication date | 2020-6 |
| Conference name | 20th euspen International Conference and Exhibition |
| Conference date | 08-06-2020 to 12-06-2020 |
| Conference place | Online Conference |
| Web URL | https://www.euspen.eu/knowledge-base/ICE20131.pdf |
| Language | English |
| Persistent Identifier | https://www.euspen.eu/knowledge-base/ICE20131.pdf |