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Fundamental parameter determination to improve spectroscopical methods

Beckhoff, B., Pollakowski, B., Muller, M. (Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany), Honicke, P. (Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, Germany) and Kolbe, M. (Physikalisch-Technische Bundesanstalt (PTB), Abbestr.2-12, 10587 Berlin, Germany)
Keywords:

X-ray fluorescence, atomic fundamental parameters, fluorescence yields, optical constants, spectroscopy

Document typeProceeding
Journal title / SourcePrecision Electromagnetic Measurements (CPEM 2016), 2016 Conference on
Publisher's nameIEEE
Publication date 2016-07-10
Conference name2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Conference date10-07-2016 to 15-07-2016
Conference placeOttawa
DOI10.1109/CPEM.2016.7540520
LanguageEnglish

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