Measurement of aspheres and free-form surfaces in a non-null test interferometer: Reconstruction of high-frequency errors
Baer G., Schindler J., Siepmann J., Pruß C., Osten W., Schulz M.Document type | Proceedings |
Journal title / Source | Proceedings of SPIE 8788: Optical Measurement Systems for Industrial Inspection VIII |
Volume | VIII |
Publication date | 2013 |
Conference name | SPIE Optifab 2013 |
Conference date | 13 May 2013 |
Conference place | München, Germany |
DOI | 10.1117/12.2021518 |
Web URL | http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1687427 |