More insight into conducted immunity tests and investigation of support influences
Şen O., Çakır S., Acak S.CDN, Conducted Immunity, EMC, Loop Impedance, Support
Document type | Proceedings |
Journal title / Source | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) |
Volume | 2017 |
Issue | 2017 |
Page numbers / Article number | 124-126 |
Publisher's name | IEEE |
Publication date | 2017-7-13 |
Conference name | 2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) |
Conference date | 20-06-2017 to 23-06-2017 |
Conference place | Seoul |
DOI | 10.1109/APEMC.2017.7975442 |
Web URL | http://rfmw.cmi.cz/documents/papers/Sen_APEMC2017_OA.pdf |
Language | English |