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More insight into conducted immunity tests and investigation of support influences

Acak, S., Çakır, S. and Şen, O.
Keywords:

CDN, Conducted Immunity, EMC, Loop Impedance, Support

Document typeProceeding
Journal title / Source2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Volume2017
Issue2017
Page numbers / Article number124-126
Publisher's nameIEEE
Publication date 2017-07-13
Conference name2017 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
Conference date20-06-2017 to 23-06-2017
Conference placeSeoul
DOI10.1109/APEMC.2017.7975442
Web URLhttp://rfmw.cmi.cz/documents/papers/Sen_APEMC2017_OA.pdf
LanguageEnglish

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