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Comparison between time- and frequency-domain high-frequency device characterizations

Bieler, M. (Physikalisch-Technische Bundesanstalt, Braunschweig, Germany) and Arz, U. (Physikalisch-Technische Bundesanstalt, Braunschweig, Germany)
Keywords:

high-frequency devices, vector network analyzer, electro-optic sampling

Document typeProceeding
Journal title / SourceCPEM 2016, Conference on Precision Electromagnetic Measurements: conference digest: (2016)
Peer-reviewed articleYes
Publisher's nameIEEE
Publication date 2016-08-11
Conference nameCPEM 2016, Conference on Precision Electromagnetic Measurements
Conference date10-15 July 2016
Conference placeOttawa, Canada
ISSN2160-0171
DOI10.1109/CPEM.2016.7540727
Web URLhttp://dx.doi.org/10.1109/CPEM.2016.7540727
LanguageEnglish
Persistent Identifierhttps://oar.ptb.de/resources/show/10.7795/EMPIR.14IND02.CA.20190403E

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