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LSMO thin films with high metal–insulator transition temperature on buffered SOI substrates for uncooled microbolometers

Chromik, Š. (Institute of Electrical Engineering, SAS), Štrbík, V. (Institute of Electrical Engineering, SAS), Dobročka, E. (Institute of Electrical Engineering, SAS), Roch, T. (Comenius University, Slovakia), Rosová, A. (Institute of Electrical Engineering, SAS), Španková, M. (Institute of Electrical Engineering, SAS), Lalinský, T. (Institute of Electrical Engineering, SAS), Vanko, G. (Institute of Electrical Engineering, SAS), Lobotka, P. (Institute of Electrical Engineering, SAS), Ralbovský, M. (Slovak Institute of Metrology,) and Choleva, P. (Vorarlberg University of Applied Sciences, Austria)
Keywords:

LSMO thin films, BTO/CeO2/YSZ buffered SOI substrate, Pulsed laser deposition, TCR coefficienta

Document typeArticle
Journal title / SourceApplied Surface Science
Peer-reviewed articleYes
Volume302
Issuen/a
Page numbers / Article number30-33
Publisher's nameElsevier
Publisher's address (city only)n/a
Publication date 2014-09-1
ISSN0169-4332
DOI10.1016/j.apsusc.2014.05.051
LanguageEnglish

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