Welcome to the EURAMET Repository Link

The EURAMET Repository Link is an online service providing links to scientific papers published within the European Metrology Research Programme (EMRP), the European Metrology Programme for Innovation and Research (EMPIR) and projects funded by iMERA-Plus.

Observing and measuring strain in nanostructures and devices with transmission electron microscopy

Hytch, MH (CEMES-CNRS, 29 Rue Jeanne Marvig, 31055 Toulouse Cedex 4, France) and Minor, AMM (University of California, Berkeley, CA, United States)
Keywords:

Nanostructure, silicon, stress/strain relationship, transmission electron microscopy

Document typeArticle
Journal title / SourceMRS Bulletin
Peer-reviewed articleYes
Volume39
Issue2
Page numbers / Article number138-146
Publisher's nameCambridge University Press
Publisher's address (city only)Cambridge
Publication date 2014-02-12
ISSN0883-7694
DOI10.1557/mrs.2014.4
Web URLhttps://www.cambridge.org/core/journals/mrs-bulletin/article/observing-and-measuring-strain-in-nanostructures-and-devices-with-transmission-electron-microscopy/296C465E63EC9AEB189EFFE7AA4C1116
LanguageEnglish

Back to the list view