METefnet: developments in metrology for moisture in materials
Bell, S (NPL), Aro, A (UT), Arpino, F (UNICLAM), Aytekin, S (TÜBITAK UME), Cortellessa, G (UNICLAM), Dell’Isola, M (UNICLAM), Ferenčíková, Z (CMI), Fernicola, V (INRiM), Gavioso, R (INRiM), Georgin, E (CETAIT), Heinonen, M (MIKES), Hudoklin, D (UL), Jalukse, L (UT), Karaböce, N (TÜBITAK UME), Leito, I (UT), Mäkynen, A (UOULU), Miao, P (NPL), Nielsen, J (DTI), Nicolescu, I (INM), Rudolfová, M (CMI), Ojanen-Saloranta, M (MIKES), Österberg, P (UOULU, Measurepolis Development Ltd), Østergaard, P (DTI), Rujan, M (INM), Sega, M (INRiM), Strnad, R (CMI) and Vachova, T (CMI)Development - Moisture in materials
| Document type | Article |
| Journal title / Source | 17th International Congress of Metrology |
| Peer-reviewed article | Yes |
| Volume | 17th |
| Issue | 2015 |
| Page numbers / Article number | 15003 |
| Publisher's name | EDP Sciences |
| Publisher's address (city only) | London |
| Publication date | 2015-09-21 |
| ISSN | NA |
| DOI | 10.1051/metrology/20150015003 |
| Web URL | http://cfmetrologie.edpsciences.org/articles/metrology/abs/2015/01/metrology_metr2015_15003/metrology_metr2015_15003.html |
| Language | English |