Reference data sets for testing metrology software
Kok, GJPK (VSL, Thijsseweg 11, 2629 JA Delft, The Netherlands), Harris, PMH (National Physical Laboratory, Hampton Road, TW11 0LW Middlesex), Smith, IMS (National Physical Laboratory, Hampton Road, TW11 0LW Middlesex) and Forbes, ABF (National Physical Laboratory, Hampton Road, TW11 0LW Middlesex)Document type | Article |
Journal title / Source | Metrologia |
Peer-reviewed article | Yes |
Volume | 53 |
Issue | 4 |
Page numbers / Article number | 1091-1100 |
Publisher's name | IOP Publishing |
Publisher's address (city only) | London |
Publication date | 2016-07-6 |
ISSN | 0026-1394 |
DOI | 10.1088/0026-1394/53/4/1091 |
Web URL | http://iopscience.iop.org/article/10.1088/0026-1394/53/4/1091 |
Language | English |