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Atomic force microscope adhesion measurements and atomistic molecular dynamics simulations at different humidities

Seppä, J (VTT MIKES, Espoo, Finland), Reischl, B (Curtin University, Perth, Australia), Sairanen, H (VTT MIKES, Espoo, Finland), Korpelainen, V (VTT MIKES, Espoo, Finland), Husu, H (VTT MIKES, Espoo, Finland, and nLIGHT Finland, Lohja, Finland), Heinonen, M (VTT MIKES, Espoo, Finland), Raiteri, P (Curtin University, Perth, Australia), Rohl, A (Curtin University, Perth, Australia), Nordlund, K (University of Helsinki, Helsinki, Finland) and Lassila, A (VTT MIKES, Espoo, Finland)
Keywords:

Atomic force microscopy, metrology, adhesion, capillary effects, humidity, force measurement

Document typeArticle
Journal title / SourceMeasurement Science and Technology
Peer-reviewed articleYes
Volume28
Issue3
Page numbers / Article number034004 (10pp)
Publisher's nameIOP Publishing
Publisher's address (city only)Bristol
Publication date 2017-01-23
ISSN0957-0233
DOI10.1088/1361-6501/28/3/034004
Web URLhttp://iopscience.iop.org/article/10.1088/1361-6501/28/3/034004/meta;jsessionid=1CDCAA65608F84971489636A33CB4FD2.c3.iopscience.cld.iop.org
LanguageEnglish

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