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3D/2D radiation pattern measurement of different GSM phones for EMC applications

SALHI, Mohammed (TÜBİTAK UME), Şen, Osman (TÜBİTAK UME), Çakır, Soydan (TÜBİTAK UME) and Çetintaş, Mustafa (TÜBİTAK UME)
Keywords:

Alternative test methods, EMC, GSM, Radiation pattern, Radiated immunity

Document typeProceeding
Journal title / Source2016 International Symposium on Electromagnetic Compatibility - EMC Europe
Peer-reviewed articleYes
Volume2016
Issue2016
Page numbers / Article number695-700
Publisher's nameIEEE
Publisher's address (city only)USA
Publication date 2016-09-9
Conference name2016 International Symposium on Electromagnetic Compatibility - EMC Europe
Conference date05-09-2016 to 09-09-2016
Conference placeWroclaw
ISSN2325-0364
DOI10.1109/EMCEurope.2016.7739219
ISBN978-1-5090-1416-3
Web URLhttp://ieeexplore.ieee.org/document/7739219/
LanguageEnglish

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