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Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy


Lattice reorientation tetragonal PMN-PT

Document typeArticle
Journal title / SourceJournal of Applied Physics 121, 055302 (2017); doi: 10.1063/1.4975114
Peer-reviewed articleYes
Volume121, 055302 (2017);
Issue121, 055302 (2017);
Page numbers / Article numbernot provided in pdf
Publisher's nameAmerican Institute of Physics
Publisher's address (city only)Not provided
Publication date 2017-02
Web URLhttp://aip.scitation.org/doi/abs/10.1063/1.4975114

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