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Investigating the Intrinsic Noise Limit of Dayem Bridge NanoSQUIDs

Patel, T (NPL, Teddington, UK), Li, B (NPL, Teddington, UK), Gallop, J (NPL, Teddington, UK), Cox, D (NPL, Teddington, UK), Kirby, K (University of Surrey, Guildford, UK), Romans, E (London Center for Nanotechnol., Univ. Coll. London, London, UK), Chen, J (School of Engineering & Design, Brunel Univeristy, Uxbridge, UK), Nisbet, A (Uniersity of Surrey, Guildford, UK) and Hao, L (NPL, Teddington, UK)
Keywords:

SQUIDs, Noise, Junctions, Critical current density (superconductivity), Nanoscale devices, Preamplifiers, Niobium

Document typeArticle
Journal title / SourceIEEE Transactions on Applied Superconductivity
Peer-reviewed articleYes
Volume25
Issue3
Page numbers / Article number1602105
Publisher's nameIEEE
Publisher's address (city only)Melville
Publication date 2014-10-24
ISSN1051-8223
DOI10.1109/TASC.2014.2364920
Web URLhttp://ieeexplore.ieee.org/document/6936295/?reload=true&arnumber=6936295
LanguageEnglish

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