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Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)

Yang, L (Analytical Science Division, National Physical Laboratory, Teddington), Seah, M (Analytical Science Division, National Physical Laboratory, Teddington), Gilmore, I .S (Analytical Science Division, National Physical Laboratory, Teddington), Morris, R.J.H (University of Warwick, Department of Physics, Gibbet Hill Rd, Coventry CV4 7AL, UK.), Dowsett, M.G (University of Warwick, Department of Physics, Gibbet Hill Rd, Coventry CV4 7AL, UK.), Boarino, L (Electromagnetism Division, Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, 10135 Turin, Italy.), Sparnacci, K (Department of Science and Technological Innovation (DISIT), University of East Piedmont, via T. Michel 11, 15122 Alessandria, Italy.) and Laus, M (Department of Science and Technological Innovation (DISIT), University of East Piedmont, via T. Michel 11, 15122 Alessandria, Italy.)
Keywords:

cluster ion beams, core-shell, melting, SEM, Stöber silica, SiO2

Document typeArticle
Journal title / SourceJ. Phys. Chem. C
Peer-reviewed articleYes
Volume117
Issue31
Page numbers / Article number16042-16052
Publisher's nameAmerican chemical society
Publisher's address (city only)Washington DC
Publication date 2016
ISSN1932-7447
DOI10.1021/jp4048538
Web URLhttp://pubs.acs.org/doi/abs/10.1021/jp4048538
LanguageEnglish

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