Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)
Yang, L (Analytical Science Division, National Physical Laboratory, Teddington), Seah, M (Analytical Science Division, National Physical Laboratory, Teddington), Gilmore, I .S (Analytical Science Division, National Physical Laboratory, Teddington), Morris, R.J.H (University of Warwick, Department of Physics, Gibbet Hill Rd, Coventry CV4 7AL, UK.), Dowsett, M.G (University of Warwick, Department of Physics, Gibbet Hill Rd, Coventry CV4 7AL, UK.), Boarino, L (Electromagnetism Division, Istituto Nazionale di Ricerca Metrologica, Strada delle Cacce 91, 10135 Turin, Italy.), Sparnacci, K (Department of Science and Technological Innovation (DISIT), University of East Piedmont, via T. Michel 11, 15122 Alessandria, Italy.) and Laus, M (Department of Science and Technological Innovation (DISIT), University of East Piedmont, via T. Michel 11, 15122 Alessandria, Italy.)cluster ion beams, core-shell, melting, SEM, Stöber silica, SiO2
| Document type | Article |
| Journal title / Source | J. Phys. Chem. C |
| Peer-reviewed article | Yes |
| Volume | 117 |
| Issue | 31 |
| Page numbers / Article number | 16042-16052 |
| Publisher's name | American chemical society |
| Publisher's address (city only) | Washington DC |
| Publication date | 2016 |
| ISSN | 1932-7447 |
| DOI | 10.1021/jp4048538 |
| Web URL | http://pubs.acs.org/doi/abs/10.1021/jp4048538 |
| Language | English |