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High-speed atomic force microscopy for materials science

Payton, O.D. (University of Bristol, Bristol, UK), Picco, L. (University of Bristol, Bristol, UK) and Scott, T.B. (University of Bristol, Bristol, UK)
Keywords:

Atomic force microscopy, AFM, High-speed AFM, Nanoscale analysis

Document typeArticle
Journal title / SourceInternational Materials Reviews
Peer-reviewed articleYes
Volume61
Issue8
Page numbers / Article number473-494
Publisher's nameTaylor & Francis
Publisher's address (city only)London
Publication date 2016-06-14
DOI10.1080/09506608.2016.1156301
Web URLhttp://www.tandfonline.com/doi/abs/10.1080/09506608.2016.1156301?journalCode=yimr20
LanguageEnglish

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