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Design and manufacturing of a high accuracy planarscanner for millimeter wave applications

Le Coq, L (IETR University of Rennes 1) and Fuchs, B (IETR University of Rennes 1)
Keywords:

design engineering;image scanners;millimetre wave devices;planar antennas;IETR compact range;accuracy planar 2D scanner;design;planar millimeter wave measurements;quiet zone probing;Accuracy;Antenna measurements;Antennas;Extraterrestrial measurements;Measurement uncertainty;Millimeter wave measurements;Semiconductor device modeling

Document typeProceeding
Journal title / SourceDigest of IEEE Conference on Antenna Measurements & Applications (CAMA), 2014
Volumen/a
Issuen/a
Page numbers / Article number1- 4
Publisher's nameIEEE
Publisher's address (city only)n/a
Publication date 2014-11-16
Conference name2014 IEEE Conference on Antenna Measurements & Applications (CAMA)
Conference date16-19 Nov. 2014
Conference placeAntibes Juan-les-Pins , France
ISSNn/a
DOI10.1109/CAMA.2014.7003388
ISBNn/a
Web URLhttp://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7003388&isnumber=7003303
LanguageEnglish

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