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Surface mapping of field induced piezoelectric strain at elevated temperatures employing full-field interferometry

Stevenson, TS (Institute for Materials ResearchUniversity of Leeds), Quast, TQ (Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116, Braunschweig), Bartl, GB (Physikalisch-Technische Bundesanstalt, Bundesallee 100, D-38116, Braunschweig), Schmitz-Kempen, TSK (aixACCT Systems GmbH, Talbotstr. 25, 52068, Aachen, Germany) and Weaver, PMW (National Physical Laboratory, Hampton Road, TW11 0LW Middlesex, United Kingdom)
Document typeArticle
Journal title / SourceIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Peer-reviewed articleYes
Volume62
Issue1
Page numbers / Article number88-96
Publisher's nameInstitute of Electrical and Electronics Engineers (IEEE)
Publication date 2015-01
ISSN0885-3010
DOI10.1109/TUFFC.2014.006683
Web URLhttp://ieeexplore.ieee.org/document/7002928/?arnumber=7002928
LanguageEnglish

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