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Depth Resolution, Angle-Dependence and the Sputtering Yield of Irganox 1010 by Coronene Primary Ions

Seah, M.P. (Analytical Science Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UK.), Spencer, S.J. (Analytical Science Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UK.) and Shard, A.G. (Analytical Science Division, National Physical Laboratory, Teddington, Middlesex TW11 0LW, UK.)
Keywords:

cluster ions, depth profiling, organic layers, SIMS, XPS.

Document typeArticle
Journal title / SourceJournal of Physical Chemistry
Peer-reviewed articleYes
Volume117
Issue39
Page numbers / Article number11885–11892
Publisher's nameACS
Publisher's address (city only)Washington DC
Publication date 2013-10-6
DOI10.1021/jp408168z
Web URLhttp://pubs.acs.org/doi/abs/10.1021/jp408168z
LanguageEnglish

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