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Noncontact Atomic Force Microscopy Volume 3 Chapter 3: Simultaneous nc-AFM/STM Measurements with Atomic Resolution

Hapala, P. (FZU), Ondrácek, M. (FZU), Stetsovych, O. (FZU), Švec, M. (FZU) and Jelínek, P. (FZU)
Keywords:

AFM/STM measurements

Document typeContribution to book
Book titleNoncontact Atomic Force Microscopy
Volume3
Page numbers / Article number29-24
Publisher's nameSpringer International Publishing Switzerland
Publication date 2015
DOI10.1007/978-3-319-15588-3_3
ISBN978-3-319-15587-6
LanguageEnglish

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