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Comparison Between GaAs and Graphene QHR Standards for Resistance Realisation at SP

Bergsten, T. (SP, Sweden) and Eklund, G. (SP, Sweden)
Keywords:

Calibration, graphene, quantum Hall effect, resistance standard

Document typeProceeding
Journal title / SourceDigest on Conference on Precision Electromagnetic Measurements (CPEM2016)
Peer-reviewed articleYes
Publisher's nameIEEE
Publication date 2016
Conference nameCPEM 2016
Conference date10-07-2016 to 15-07-2016
Conference placeOttawa, Canada
ISSN2160-0171
DOI10.1109/CPEM.2016.7540514
ISBN978-1-4673-9134-4
Web URLhttp://ieeexplore.ieee.org/document/7540514/
LanguageEnglish

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