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Quantum Hall resistance standard in graphene devices under relaxed experimental conditions

Lafont, F. (LNE, France), Ribeiro-Palau, R. (LNE, France), Kazazis, D. (LPN, France), Michon, A. (LPN, France), Couturaud, O. (L2C, France), Consejo, C. (L2C, France), Chassagne, T. (NOVASiC, France), Zielinski, M. (NOVASiC, France), Portrail, M. (CRHEA, France), Jouault, B. (L2C, France), Schopfer, F. (LNE, France) and Poirier, W. (LNE, France)
Keywords:

graphene, QHR, measurement

Document typeArticle
Journal title / SourceNature Nanotechnology
Peer-reviewed articleYes
Volume10
Page numbers / Article number965-971
Publisher's nameMacmillan Publishers
Publication date 2015-04-20
DOI10.1038/ncomms7806
Web URLhttps://www.ptb.de/emrp/resources/documents/graphohm/Sonstige_Fotos/NatureComms7806-2015-Lafont.pdf
LanguageEnglish

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