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G-SIMS analysis of organic solar cell materials

Franquet, A. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium), Fleischmann, C. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium), Conard, T. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium), Voroshazi, E. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium), Poleunis, C. (UCL, ICMN, Croix du Sud, 1 bte 3; Bât. Boltzmann (a1),B-1348 Louvain-la-Neuve, Belgium), Havelund, R. (NPL, National Physical Laboratory, Teddington, Middlesex, TW11 0LW, United Kingdom), Delcorte, A. (UCL, ICMN, Croix du Sud, 1 bte 3; Bât. Boltzmann (a1),B-1348 Louvain-la-Neuve, Belgium) and Vandervorst, W. (IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium and Instituut voor Kern- en Stralingsfysica, K. U. Leuven, Celestijnenlaan 200D, B-3001 Leuven, Belgium)
Keywords:

TOF-SIMS, Gentle-SIMS (G-SIMS), organic solar cell, PC70BM, PCDTBT

Document typeArticle
Journal title / SourceSurface and Interface Analysis
Peer-reviewed articleYes
Volume1
Issue46
Page numbers / Article number96-99
Publisher's nameWiley Online Library
Publisher's address (city only)New Jersey NYC
Publication date 2014-09-12
ISSN0142-2421
DOI10.1002/sia.5650
Web URLhttp://onlinelibrary.wiley.com/doi/10.1002/sia.5650/full
LanguageEnglish

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