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Spatially resolved electrical characterisation of graphene layers by an evanescent field microwave microscope

Gregory, A (NPL. Teddington, UK), Hao, L (NPL. Teddington, UK), Klein, N (ICL, London, UK), Gallop, J (NPL. Teddington, UK), Mattevi, C (ICL, London, UK), Shaforost, O (ICL, London, UK), Lees, K (NPL. Teddington, UK) and Clarke, B (NPL. Teddington, UK)
Keywords:

evanescent field microwave microscope, traceable measurements, graphene

Document typeArticle
Journal title / SourcePhysica E: Low dimensional systems and nanostructures
Peer-reviewed articleYes
Volume56
Issuen/a
Page numbers / Article number431 - 434
Publisher's nameElsevier
Publisher's address (city only)Amsterdam
Publication date 2014-02-1
ISSNn/a
DOI10.1016/j.physe.2012.10.006
Web URLhttp://www.sciencedirect.com/science/article/pii/S1386947712004018
LanguageEnglish

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