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Impact of Microwave Measurement Uncertainty on the Nonlinear Embedding Procedure

Bosi, G. (KU Leuven & University of Ferrara), Raffo, A. (University of Ferrara), Avolio, G. (KU Leuven), Schreurs, D. (KU Leuven) and Humphreys, D. A. (National Physical Laboratory)

Microwave measurements uncertainty, microwave transistors, nonlinear embedding, power amplifiers, vector-calibrated nonlinear measurements.

Document typeProceeding
Journal title / SourceN/A
Peer-reviewed articleYes
Page numbers / Article number1-4
Publisher's nameIEEE
Publisher's address (city only)Piscataway
Publication date 2016-05-27
Conference name87th ARFTG Microwave Measurement Conference
Conference date27-05-2016
Conference placeSan Francisco, CA, USA
Web URLhttp://www.arftg.org/
Persistent IdentifierIEEE Catalog Number: CFP16ARF-ART

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